Dispersion Parameters and Electrical Characterization of Cd₁₋ₓCuₓS Thin Films Deposited by Using AACVD Technique
DOI:
https://doi.org/10.22401/Keywords:
Urbach Energy, Dispersion Parameters, SEM-EDX, AACVDAbstract
In this research, an aerosol-assisted chemical vapor deposition (AACVD) was successfully employed to synthesize Cd₁₋ₓCuₓS (0 ≤ x ≤ 1) semiconductor thin films. The structural, morphological, and optical properties of the deposited films were systematically investigated as a function of copper concentration using energy-dispersive X-ray spectroscopy (EDX), scanning electron microscopy (SEM), and UV-Vis spectroscopy. The results demonstrated that the optical behavior of the films is strongly influenced by Cu incorporation. Specifically, an increase in CdS fraction resulted in a decrease in the Urbach energy, whereas the activation energy exhibited a progressive increase with higher CuS content.
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Copyright (c) 2026 Zaid Mohammed Jasim, Nahida B. Hasan, Mohsin K. Al-khaykanee
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